Re: Bit Level Forensics Examinations - Fact or Fiction

From: Andrew Sheldon (forensicsat_private)
Date: Sun Apr 29 2001 - 07:47:15 PDT

  • Next message: Fred Mobach: "Re: Bit Level Forensics Examinations - Fact or Fiction"

    Matthew,
    
    I think you may be referring to the following techniques:
    
    Magnetic force microscopy (MFM)
    Scanning probe microscopy (SPM)
    Magnetic force scanning tunneling microscopy (STM)
    
    All of whcih are described here: http://www.fish.com/security/secure_del.html
    
    An extract:
    There are, from manufacturers sales figures, several thousand SPM's in use in the field today, some of which have special features for analysing disk drive platters, such as the vacuum chucks for standard disk drive platters along with specialised modes of operation for magnetic media analysis. These SPM's can be used with sophisticated programmable controllers and analysis software to allow automation of the data recovery process. If commercially-available SPM's are considered too expensive, it is possible to build a reasonably capable SPM for about US$1400, using a PC as a controller [6].
    
    Enjoy :-)
    
    shelly
    



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